High-power Ge detector, 1310/1550 nm laser source
(9/125 µm)
FOT-302X-235BL-XX
High-power Ge detector, 1310/1490/1550 nm
single port laser source (9/125 µm)
Auto-Wavelength Recognition
The FOT-300’s built-in source can transmit with a wavelength-identification digital encrypted protocol, so that any compatible unit—the FPM-300 Power Meter and the FOT-300’s receiver—can automatically use the proper
calibration parameters.
This feature reduces the need for communication between the two technicians and decreases the potential for error.
Distant Referencing
Signal encrypting can also give the receiving end information on the power
to be used as reference, helping ensure efficient referencing, even when the two units are far apart.
No offset nulling
Thanks to its unique design, the FOT-300 Optical Loss Test Set reduces
measurement time in typical measurement situations, as the need for an offset nulling is eliminated.
FTTx Ready
EXFO’s FLS-300 allows for the testing of passive optical networks (PONs)
at 1310 nm, 1490 nm and 1550 nm, the three wavelengths recommended
by the ITU-T (G.983.3) for PON
